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Particle characterization in technology, v.1: applications and microanalysis

by John, Keith Beddow.
Type: materialTypeLabelBookPublisher: CRC Boca Raton, florida 1984Description: 246p.ISBN: 0-8493-5784-5.Online resources: http://14.139.222.13:80/cgi-bin/koha/opac-detail.pl?biblionumber=9214
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539.2:6 P21 (Browse shelf) Available 28373

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